test_spec: LTD: Memory BW Test - probable issue caused by md to rst conversion 61/2461/4
authorAl Morton <acmorton@att.com>
Fri, 2 Oct 2015 01:18:09 +0000 (02:18 +0100)
committerMaryam Tahhan <maryam.tahhan@intel.com>
Thu, 15 Oct 2015 16:40:35 +0000 (16:40 +0000)
commitfeab46f1583db64f69f38fa01cd68371c1c60953
treeafcf9dbc4ece4eb75c0509f233dd27c1e4f5dec5
parent8e49abe59fa559e319ce5a956c74881a6e0184a7
test_spec: LTD: Memory BW Test - probable issue caused by md to rst conversion

The following text in the Description needs to be formatted as a list in .RST:
Furthermore: - the ratio of reads to writes should be recorded.

JIRA: VSPERF-109

Change-Id: I3b6c819d1ac07cc466c747d3552cbcc4de5f34bf
Signed-off-by: Al Morton <acmorton@att.com>
Reviewed-by: Maryam Tahhan <maryam.tahhan@intel.com>
Reviewed-by: Billy O'Mahony<billy.o.mahony@intel.com>
Reviewed-by: Gene Snider <eugene.snider@huawei.com>
docs/to-be-reorganized/vswitchperf_ltd.rst